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Home
Research
Teaching
Publications
Interesting
Readings
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Publications:
 | T. Xia, XL. Xu, A. Venkatachalam and D. Huston,
“Development of a High Speed UWB
GPR for Rebar Detection”, Accepted by IEEE
International
Conference on Ground Penetrating Radar (GPR) 2012. | | T. Platt, T. Xia, M. Slamani, "Computing EVM in Real Time for Wireless Communication Test", Proceedings of IEEE North Atlantic Test
Workshop (NATW), May 2012. | | T. Xia, A. S. Venkatachalam, D. Huston,"A High Performance Low Ringing Ultra-Wideband Monocycle Pulse Generator", IEEE Transactions on Instrumentation and
Measurement.vol. 61, Issue 1. 2012. pp. 261-266. (J). | | B. Jiang, T. Xia, "An Analytical Model for All-Digital PLL Phase Noise Characterization", Proceedings of IEEE North Atlantic Test
Workshop (NATW), May 2011. | | B. Jiang, T. Xia, "Model Analysis of Multi-Finger MOSFET Layout in Ring Oscillator Design", Proceedings of IEEE
International Symposium on Quality Electronic Design (ISQED), 2011. |
| T. Xia, K. Ngai, D.
Huston, K. Ebnabbasi, R. Birken, D. Busuioc, M. Wang “Compact Programmable Ground Penetrating
Radar System for Roadway and Bridge Deck Characterization”, Proceedings of SPIE Smart Structures/NDE conference,
2011. | | T. Xia, “Analytical
Model for Spread-Spectrum Clock Generator Circuit Characterization”, International Journal of Circuit
Theory and Applications, 2010. (in press) - Wiley (J). | | T. Xia, D. Mu, "High Speed Interconnect Data Dependent Jitter Analysis", Microelectronics Journal,
Vol.41, 2010, pp. 371-379. - Elsevier Science. (J). |
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C. Leblanc, B. Voegeli, T. Xia, "Dual-Loop Direct VCO Modulation for
Spread Spectrum Clock Generation", Proceedings of IEEE Custom
Integrated Circuits Conference (CICC), September 2009. |
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C. Chiu, T. Xia, "Resistance Modeling for Noise Coupling in Lightly Doped
Silicon Substrate", IEEE North Atlantic Test
Workshop (NATW), May
2009. |
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O. Lemaire, T. Xia, "Design of a Monolithic Width Programmable Gaussian
Monocycle Pulse Generator for Ultra Wideband Radar in CMOS
Technology", Joint IEEE NEWCAS
and TAISA conference, June 2009. |
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J. Smith, T. Xia, "High-Resolution
Delay Testing of Interconnect Paths in Field Programmable Gate Arrays",
IEEE Transactions on Instrumentation
and Measurement. vol.
58, No. 1, Jan. 2009. pp.187-195.
(J). |
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M. Ertürk,
T. Xia, R.Wolf, D. Scagnelli, W.F. Clark, "Statistical
Variations in VCO Phase Noise due to Upconverted MOSFET 1/f Noise",
Proceedings of IEEE Radio Frequency Integrated Circuits Symposium (RFIC), June 2008. |
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T. Xia, P. Peng, "A Spread-Spectrum Clock Generator with
Dual-Voltage Controlled Oscillator",
Proceedings of Joint IEEE NEWCAS
and TAISA conference, June 2008. |
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H. Zheng, J. Ahrens, T. Xia, “A Compositional Method with Failure-Preserving
Abstractions for Asynchronous Design
Verification”, IEEE Transactions on Computer-Aided
Design of Integrated Circuits and Systems. vol. 27, No. 7, 2008. pp.
1343-1347
(J) |
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T. Xia, S. Wyatt,
"High
Output Resistance and Wide Swing Voltage Charge Pump Circuit",
Proceedings of
IEEE
International Symposium on Quality Electronic Design (ISQED) March 2008. |
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M. Ertürk,
T. Xia, W.F. Clark, "Gate Voltage Dependence of MOSFET 1/f Noise
Statistics", IEEE Electron Device Letters. Vol. 28, No.9. 2007.
pp.812-814. (J) |
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J. Smith, T. Xia, "High Precision Delay Testing
of Virtex-4 FPGA Design", IEEE International Midwest Symposium on Circuits &
Systems 2007. (MWSCAS) |
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T. Xia, H. Zheng, "Timing Jitter
Characterization for Mixed Signal production Test Using the Interpolation
Algorithm", IEEE Transactions on Industrial Electronics. Vol. 54, No.2,
2007. pp.1014-1023.(J) |
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T. Xia, K. Feng and W. Yung, “Low Reflection High-Speed Simultaneous
Bi-Directional
Data
Bus”, Journal of Circuits, Systems and Computers. vol. 16, No. 1, 2007.
pp.43-50.
(J) |
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T. Xia, T. Campbell, J. Li, R. Wolf and J. F. Sweeney, "Jitter Measurement
Circuit for Mixed Signal Production Test", Journal of Measurements,
Elsevier Science. vol.40, 2007. pp.272-282.(J) |
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J. Smith, T. Xia, C. Stroud, "An Automated BIST Architecture for Testing
and Diagnosing FPGA Interconnect Faults", Journal of Electronics Test:
Theory and Applications, July 2006. pp.239-253. Springer
Science. (JETTA) (J) |
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T. Xia, S. Wyatt, R. Ho, “Employing On-Chip Jitter Test Circuit for Phase
Locked Loop Self-Calibration”, Proceedings of IEEE International
Symposium of Defect and Fault Tolerance in VLSI Systems (DFT),
November
2006. |
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D. Mu, T. Xia, H. Zheng, “Data Dependent Jitter Characterization Based on
Fourier Analysis”, Proceedings of IEEE International Symposium of Defect
and Fault Tolerance in VLSI Systems (DFT), November
2006. |
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C. S. Chen, J. C. Lo, T. Xia, “Equivalent IDDQ Tests for Systems with
Regulated Power Supply”, Proceedings of IEEE International Symposium of
Defect and Fault Tolerance in VLSI Systems (DFT), November
2006. |
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T. Xia, S. Wyatt, R. Ho, "Automated Calibration of Phase Locked Loop
with On-Chip Jitter Test", Proceedings of IEEE North Atlantic Test
Workshop (NATW), May 2006. |
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C. Chiu, T. Xia, “Jitter in Voltage Control Oscillator Due to Internal,
External Power Supply Noise”, Proceedings of IEEE North Atlantic Test
Workshop (NATW), May 2006. |
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J. Smith, T. Xia, C. Stroud, “A BIST Approach for Detection, Diagnosis of
FPGA Interconnect Faults”, Proceedings of IEEE North Atlantic Test
Workshop (NATW), May 2006. |
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C. S. Chen, J.C.Lo, T. Xia, "An Indirect Current
Sensing Technique for IDDQ and IDDT Tests",
ACM Great Lakes Symposium
on VLSI (GLSVLSI), April 2006. |
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M. Ertürk,
R. Anna, K.M. Newton, T. Xia, W.F. Clark,
"BSIM Model for Mosfet Flicker Noise
Statistics: Technology Scaling, Area, and Bias Dependence", Nano Science
and Technology Institute Workshop on Compact Modeling 2006. |
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T. Compbell, T. Xia, "Xilinx
Embedded Ethernet MACs Negotiate Data", Xilinx Xcell Journal, December
2005. (magazine) |
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M. Erturk, T. Xia, R. Anna, K.M. Newton, E.
Adler, "Statistical BSIM Model of MOSFET 1/f Noise", IEE
Electronics Letters, vol. 41, Issue 22, Oct. 2005. pp. 1208-1209.(J) |
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P. Song, S. Polonsky, F. Stellari, K. Jenkins, A. Weger, T. Xia, S. Cho,
"CMOS IC Diagnosis Using the Light Emission from off-State Leakage
Currents (LEOSLC)", Journal of Electronic Device Failure Analysis,
vol.7, issue 3, August 2005. pp.14-21. (J) |
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J. Smith, T. Xia, "Automated BIST Testing of Delay Faults in FPGA
Interconnect", IEEE North Atlantic Test Workshop (NATW), May 2005. (won
The Best Student Paper Award) |
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T. Campbell, J. Li, R.Wolf, T.
Xia, "FPGA based Low-cost Jitter Measurement Circuits for Mixed-signal
Production Test",
IEEE
North Atlantic Test Workshop (NATW), May 2005.
Also presented at IBM 1st PLL Best Practices Conference, IBM T.J. Watson
Research
Center,Yorktown Height, NY. September 2005. |
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T.
Xia, H. Zheng, J. Li and A Ginawi,
“Self-Refereed On-Chip Jitter Measurement Circuit Using
Vernier Oscillators”, IEEE Computer Society
Annual Symposium on VLSI (ISVLSI), May 2005.
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T.
Xia, P.Song, H. Zheng, "Characterizing the VCO Jitter due to the
Digital Simultaneous Switching Noise", ACM Great Lakes Symposium
on VLSI (GLSVLSI), April 2005. |
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T.
Xia, J.C. Lo, "On-Chip Short-Time Interval Measurement for High Speed
Signal Timing Characterization", Journal of
Systems Architecture, Elsevier Science. pp.265-274, April 2005. (J)
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P.Song,
F.Stellari, T. Xia, and A. J.Weger "A Novel Scan Chain Diagnostics Technique
Based on Light Emission from Leakage Current", IEEE International
Test Conference (ITC), October 2004. |
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F. Stellari, P. Song,
T. Xia, A.J. Weger, "Broken Scan Chain Diagnostics based on Time-Integrated
and Time-Dependent Emission Measurements", IEEE International
Symposium for Testing and Failure Analysis (ISTFA), 2004.
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M. Erturk, R. Anna, T.
Xia, W.F. Clark, K.M. Newton, J.J. Pekarik, C.J. Lamothe, M.R. Lacroix,
“Low-Frequency Noise of 90nm nFETs: Hot-Carrier Degradation and Deuterium
Effect”, IEEE Topical Meeting on Si Monolithic ICs in RF Systems (SiRF), September 2004
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J. Smith, T. Xia,
"PRMC: A Multicontext FPGA with Partially Reconfigurable Logic
Planes", IEEE NEWCAS'04. |
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T.
Xia, P. Song, K. A. Jenkins, J.C.Lo, "Delay Chain Based
Programmable Jitter Generator", IEEE European Test Symposiums (ETS), May 2004.
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T. Xia, P. Song, K. A. Jenkins, J.C. Lo, "Programmable
Jitter Generator Design Using Delay Chain", IEEE North Atlantic Test
Workshop (NATW), May 2004. |
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T. Xia, J.C. Lo, “
On-Chip Short Time Interval Measurement
for Testing High Speed Communication
Signals”, IEEE Asian Test Symposium (ATS),
November 2003. |
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T. Xia, J.C. Lo, “Time-To-Voltage Converter for
On-Chip Jitter Measurement”,
IEEE Transactions on Instrumentation
and Measurement, vol.
52, No. 6, Dec. 2003, pp.1738-1748.(J)
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T. Xia, J.C. Lo, “On-Chip Long Term Jitter Measurement for
PLLs”, IEEE North Atlantic Test Workshop (NATW), May 2003.
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T. Xia, J.C. Lo. “On-Chip Jitter Measurement for Phase
Locked Loops”, IEEE International Symposium on Defect and Fault Tolerance in
VLSI Systems (DFT), pp. 399-408, November 2002.
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W. Yung, T. Xia, G. Fischer and A. J.Davis “Process Dependency
of MOSFET Depletion Mode MOS Capacitors in Series Compensation”, Proceedings
of IEEE MIDWEST Symposium on
Circuits and Systems-MWSCAS,
August 2002.
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K.S.Bum,
T. Xia, J.C. Lo. “Efficient Error Prediction in FPGA,”
IEEE International
Symposium of Defect and Fault Tolerance
in VLSI Systems (DFT), pp. 176-182,
October 2001.
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T.
Xia, L. Chen, Z.M.Yu, “MPEG-4
Content-Based Video Coding Algorithm Analysis”,
Journal of Electronic
Engineer, vol. 10, October, 1999.(in Chinese)
(J)
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Z.Q.Gao, T. Xia,"Analysis and Implemenation of An Interactive Video on Demand (VoD) System" Journal of Electronic
Engineer, vol. 9, Sept., 1999.(in Chinese)
(J)
| | T. Xia,Z.Q.Gao, Z.M.Yu, “The Analysis of Video on Demand (VoD) System with the Queuing
Theory”, Proceedings of Chinese CATV Information Network Conference, Shanghai, December 1999.
(in Chinese) | |
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T.
Xia, J. Zhang, “Anti-Interference Technology for MCS-51 Microprocessor based Embedded System”,
Journal
of Radio, TV and Telecommunications, vol. 2, 1996.(in
Chinese) (J)
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Tian Xia